!URL
http://www.rdmag.com/Tools-And-Technology/2010/12/Microscopes-AFM-SEM-Spec-Guide-Sophisticated-Microscopy/

!Description
AFMs and SEMs both provide high resolution and advanced analytical information. An SEM scans a sample’s surface with a high-energy beam of electrons. The electrons interact with the atoms of the sample to produce signals that contain information about the sample’s composition, surface topography, electrical conductivity, and other properties, resulting in a two-dimensional image. SEMs provide better depth of field than traditional optical microscopes, and allow for faster identification and counting of samples on the nanoscale due to improvements in SEM stage automation.

An AFM uses a cantilevered probe to scan a specimen’s surface, producing a three-dimensional image of the sample. The AFM probe can image and manipulate atoms and structures on a variety of surfaces by sensing chemical interactions between the probe and the surface. AFMs allow for minimal effort in sample preparation and sample handling.

Thanks to improvements in SEM electron optics and vacuum design, researchers wor
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business_public
created
Wed, 29 Dec 2010 22:33:41 GMT
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dirkjan
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Wed, 29 Dec 2010 22:33:41 GMT
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dirkjan
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microscopy
creator
dirkjan